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Strain relaxation studied by photoluminescence and by double crystal X-ray diffraction measurements in strained InGaAs
Strain relaxation studied by photoluminescence and by double crystal X-ray diffraction measurements in strained InGaAs
Strain relaxation studied by photoluminescence and by double crystal X-ray diffraction measurements in strained InGaAs
Tabata, A. (Autor:in) / Benyattou, T. (Autor:in) / Guillot, G. (Autor:in) / Clark, S. A. (Autor:in)
01.01.1994
222 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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