Buried metal layer enhanced infrared reflection absorption spectroscopy for photoreactions induced by synchrotron radiation on SiO~2 surfaces: Fid-Bau Portal

Buried metal layer enhanced infrared reflection absorption spectroscopy for photoreactions induced by synchrotron radiation on SiO~2 surfaces

Zhang, Y. / Sato, S. / Ohshima, H. / Hattori, T.

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Buried metal layer enhanced infrared reflection absorption spectroscopy for photoreactions induced by synchrotron radiation on SiO~2 surfaces

Zhang, Y. / Sato, S. / Ohshima, H. / Hattori, T.

Buried metal layer enhanced infrared reflection absorption spectroscopy for photoreactions induced by synchrotron radiation on SiO~2 surfaces

Zhang, Y. / Sato, S. / Ohshima, H. / Hattori, T.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Titel:

Buried metal layer enhanced infrared reflection absorption spectroscopy for photoreactions induced by synchrotron radiation on SiO~2 surfaces

Beteiligte:

Zhang, Y. (Autor:in) / Sato, S. (Autor:in) / Ohshima, H. (Autor:in) / Hattori, T. (Autor:in)

Erschienen in:

APPLIED SURFACE SCIENCE ; 79/80 ; 422

Erscheinungsdatum:

01.01.1994

Format / Umfang:

422 pages

ISSN:

0169-4332

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Unbekannt

Klassifikation:

DDC: 621.35

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Yokoyama, S. / Goto, H. / Miyamoto, T. et al. | British Library Online Contents | 1997

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