Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM) - Further Hardware Development to Improve Pattern Quality
Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM) - Further Hardware Development to Improve Pattern Quality
Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM) - Further Hardware Development to Improve Pattern Quality
Hjelen, J. (Autor:in) / Qvale, A. H. (Autor:in) / Gomo, O. (Autor:in)
MATERIALS SCIENCE FORUM ; 137
01.01.1994
137 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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