A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM) - Further Hardware Development to Improve Pattern Quality
Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM) - Further Hardware Development to Improve Pattern Quality
Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM) - Further Hardware Development to Improve Pattern Quality
Hjelen, J. (author) / Qvale, A. H. (author) / Gomo, O. (author)
MATERIALS SCIENCE FORUM ; 137
1994-01-01
137 pages
Article (Journal)
Unknown
DDC:
620.11
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