Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Temperature dependence of the thin film silicon-on-insulator field effect transistor current characteristics based on full solution for the one-dimensional MISIS structure
Temperature dependence of the thin film silicon-on-insulator field effect transistor current characteristics based on full solution for the one-dimensional MISIS structure
Temperature dependence of the thin film silicon-on-insulator field effect transistor current characteristics based on full solution for the one-dimensional MISIS structure
Scheinert, S. (Autor:in) / Paasch, G. (Autor:in) / Fricke, K. / Krozer, V.
01.01.1995
38 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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