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Cross-sectional observation of NaClO stain-etched Al~0~.~5Ga~0~.~5As/GaAs multilayer by atomic force microscopy
Cross-sectional observation of NaClO stain-etched Al~0~.~5Ga~0~.~5As/GaAs multilayer by atomic force microscopy
Cross-sectional observation of NaClO stain-etched Al~0~.~5Ga~0~.~5As/GaAs multilayer by atomic force microscopy
Hee Jeen Kim (Autor:in) / Jae Sung Kim (Autor:in) / Kim, Y. (Autor:in) / Moo Sung Kim (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 30 ; 678
01.01.1995
678 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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