Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Quantitative correction of backscattering in Auger electron spectroscopy of thin films
Quantitative correction of backscattering in Auger electron spectroscopy of thin films
Quantitative correction of backscattering in Auger electron spectroscopy of thin films
Leveque, G. (Autor:in) / Bonnet, J. (Autor:in)
APPLIED SURFACE SCIENCE ; 89 ; 211
01.01.1995
211 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Quantitative Rutherford Backscattering from Thin Films
British Library Online Contents | 1993
|Auger electron spectroscopy of super-doped Si:Mn thin films
British Library Online Contents | 1999
|Quantitative Auger and XPS Analysis of Thin Films
British Library Online Contents | 1992
|Quantitative Auger electron spectroscopy analysis of the Au-Ni system
British Library Online Contents | 1993
|Some Issues in Quantitative X-ray Photoelectron Spectroscopy and Auger-Electron Spectroscopy
British Library Conference Proceedings | 2001
|