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High resolution surface characterization using STM light emission techniques
High resolution surface characterization using STM light emission techniques
High resolution surface characterization using STM light emission techniques
Horn, J. (Autor:in) / Marx, N. (Autor:in) / Weiss, B. L. (Autor:in) / Hartnagel, H. L. (Autor:in) / Heusler, K. E.
01.01.1995
145 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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