Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
A critical review of ohmic and rectifying contacts for silicon carbide
A critical review of ohmic and rectifying contacts for silicon carbide
A critical review of ohmic and rectifying contacts for silicon carbide
Porter, L. M. (Autor:in) / Davis, R. F. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 34 ; 83-105
01.01.1995
23 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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