Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Frenkel Defects in Low Temperature e^--Irradiated Ge and Si Investigated by X-ray Diffraction
Frenkel Defects in Low Temperature e^--Irradiated Ge and Si Investigated by X-ray Diffraction
Frenkel Defects in Low Temperature e^--Irradiated Ge and Si Investigated by X-ray Diffraction
Bausch, S. (Autor:in) / Zillgen, H. (Autor:in) / Ehrhart, P. (Autor:in)
MATERIALS SCIENCE FORUM ; 1141-1146
01.01.1995
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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