[0115] Grown 6H-SiC Bulk Crystals Investigated by High Energy Triple Axis X-Ray Diffraction

Seitz, C. / Herro, Z. G. / Epelbaum, B. M. et al. | British Library Online Contents | 2005

Defects in Czochralski-grown silicon crystals investigated by positron annihilation

Ikari, A. | British Library Online Contents | 1995

Frenkel Defects in Low Temperature e^--Irradiated Ge and Si Investigated by X-ray Diffraction

Bausch, S. / Zillgen, H. / Ehrhart, P. | British Library Online Contents | 1995

Recrystallization Investigated by X- Ray Diffraction Imaging

Wroblewski, T. / Buffet, A. | British Library Online Contents | 2007

Twinning processes in Cu-Al-Ni martensite single crystals investigated by neutron single crystal diffraction method

Molnar, P. / Sittner, P. / Novak, V. et al. | British Library Online Contents | 2008