Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Chain length dependent polymorphism in even number n-alkanes: line profile analysis of synchrotron powder X-ray diffraction data
Chain length dependent polymorphism in even number n-alkanes: line profile analysis of synchrotron powder X-ray diffraction data
Chain length dependent polymorphism in even number n-alkanes: line profile analysis of synchrotron powder X-ray diffraction data
Craig, S. R. (Autor:in) / Hastie, G. P. (Autor:in) / Roberts, K. J. (Autor:in)
JOURNAL OF MATERIALS SCIENCE LETTERS ; 15 ; 1193-1196
01.01.1996
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
X-ray powder diffraction line profile analysis of mechanically alloyed Cu-Cr powder
| British Library Online Contents | 2009
Powder diffraction with synchrotron radiation: new perspectives
| British Library Online Contents | 1994
Crystal structures of leucites from synchrotron X-ray powder diffraction data
| British Library Online Contents | 1993
Backscattering monochromators for powder diffraction with synchrotron radiation
| British Library Online Contents | 1994
Odd-Even Differences in o-Ps Properties in Some Solid Long-Chain Alkanes
| British Library Online Contents | 2004