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    Chain length dependent polymorphism in even number n-alkanes: line profile analysis of synchrotron powder X-ray diffraction data

    New search for: Craig, S. R.
    New search for: Hastie, G. P.
    New search for: Roberts, K. J.

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    Chain length dependent polymorphism in even number n-alkanes: line profile analysis of synchrotron powder X-ray diffraction data

    New search for: Craig, S. R.
    New search for: Hastie, G. P.
    New search for: Roberts, K. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Chain length dependent polymorphism in even number n-alkanes: line profile analysis of synchrotron powder X-ray diffraction data

    New search for: Craig, S. R.
    New search for: Hastie, G. P.
    New search for: Roberts, K. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Chain length dependent polymorphism in even number n-alkanes: line profile analysis of synchrotron powder X-ray diffraction data

    Contributors:

    Craig, S. R. (author) / Hastie, G. P. (author) / Roberts, K. J. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE LETTERS ; 15 ; 1193-1196

    Publication date:

    1996-01-01

    Size:

    4 pages

    ISSN:

    0261-8028

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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