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Nondestructive Morphological Characterization of Latent and Etched Ion Tracks in PETP by SANS
Nondestructive Morphological Characterization of Latent and Etched Ion Tracks in PETP by SANS
Nondestructive Morphological Characterization of Latent and Etched Ion Tracks in PETP by SANS
Haeussler, F. (Autor:in) / Hempel, M. (Autor:in) / Birkholz, W. (Autor:in) / Kroening, M. (Autor:in) / Baumbach, H. (Autor:in)
MATERIALS SCIENCE FORUM ; 719-726
01.01.1996
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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