Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Morphological Characterization of UNCD on Etched <100> Silicon
Morphological Characterization of UNCD on Etched <100> Silicon
Morphological Characterization of UNCD on Etched <100> Silicon
Mengui, U.A. (Autor:in) / Ferreira, N.G. (Autor:in) / Baldan, M.R. (Autor:in) / Corat, E.J. (Autor:in) / Salgado, L. / Filho, F.A.
01.01.2012
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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