Damage profiling of Ar^+ sputtered Si(100) surface by medium energy ion scattering spectroscopy

Lee, J. C. / Jeong, C. S. / Kang, H. J. et al. | British Library Online Contents | 1996

Low sputter damage of metal single crystalline surfaces investigated with medium energy ion scattering spectroscopy

Moon, D.W. / Ha, Y. / Kim, H.K. et al. | British Library Online Contents | 1999

Calculation of the surface binding energy for ion sputtered particles

Kudriavtsev, Y. / Villegas, A. / Godines, A. et al. | British Library Online Contents | 2005

Depth Profiling of Al Ion-Implantation Damage in SiC Crystals by Cathodoluminescence Spectroscopy

Mitani, T. / Hattori, R. / Yoshikawa, M. | British Library Online Contents | 2009

High density Ag nanobranches decorated with sputtered Au nanoparticles for surface-enhanced Raman spectroscopy

Kim, Yong-Tae / Schilling, Joerg / Schweizer, Stefan L. et al. | British Library Online Contents | 2017