Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)

Ballard, B. L. / Predecki, P. K. / Braski, D. N. | British Library Online Contents | 1994

Proposed Methods for Depth Profiling of Residual Stresses Using Grazing Incidence X-Ray Diffraction (GIXD)

Predecki, P. / Zhu, X. / Ballard, B. | British Library Online Contents | 1993

Investigation of buried quantum dots using grazing incidence X-ray diffraction

Schroth, P. / Slobodskyy, T. / Grigoriev, D. et al. | British Library Online Contents | 2012

Grazing incidence diffraction with a sealed tube X-ray source

Van der Sluis, P. | British Library Online Contents | 1994

Crystal growth of nanosized zeolites in solutions and films In situ grazing incidence diffraction (GID) study using synchrotron X-ray radiation

Mintova, S. / Jean, B. / Metzger, T. H. et al. | British Library Online Contents | 2003