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Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)
Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)
Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)
Ballard, B. L. (Autor:in) / Predecki, P. K. (Autor:in) / Braski, D. N. (Autor:in)
01.01.1994
189 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
539.7222
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