Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
A surface extended X-ray absorption fine structure study of tellurium adsorbed onto Si(100)
A surface extended X-ray absorption fine structure study of tellurium adsorbed onto Si(100)
A surface extended X-ray absorption fine structure study of tellurium adsorbed onto Si(100)
Burgess, S. R. (Autor:in) / Cowie, B. C. C. (Autor:in) / Wilks, S. P. (Autor:in) / Dunstan, P. R. (Autor:in) / Dunscombe, C. J. (Autor:in) / Williams, R. H. (Autor:in)
APPLIED SURFACE SCIENCE ; 104/105 ; 152-157
01.01.1996
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Near Edge X-Ray Absorption Fine Structure (NEXAFS) of Molecules Adsorbed on Surfaces
Springer Verlag | 1988
|Extended x-ray absorption fine structure study on amorphous Nd-Fe-B alloys
British Library Online Contents | 1998
|Two types of graphoepitaxy of tellurium onto uniaxially-oriented polyethylene
British Library Online Contents | 1998
|Local structure study of tellurium corrosion of nickel alloy by X-ray absorption spectroscopy
British Library Online Contents | 2016
|Local structure study of tellurium corrosion of nickel alloy by X-ray absorption spectroscopy
British Library Online Contents | 2016
|