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A surface extended X-ray absorption fine structure study of tellurium adsorbed onto Si(100)
A surface extended X-ray absorption fine structure study of tellurium adsorbed onto Si(100)
A surface extended X-ray absorption fine structure study of tellurium adsorbed onto Si(100)
Burgess, S. R. (author) / Cowie, B. C. C. (author) / Wilks, S. P. (author) / Dunstan, P. R. (author) / Dunscombe, C. J. (author) / Williams, R. H. (author)
APPLIED SURFACE SCIENCE ; 104/105 ; 152-157
1996-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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