Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Controlled modification of conducting polymer surfaces by atomic force microscope
Controlled modification of conducting polymer surfaces by atomic force microscope
Controlled modification of conducting polymer surfaces by atomic force microscope
Zhou, L. (Autor:in) / Zhang, P. C. (Autor:in) / Ho, P. K. H. (Autor:in) / Xu, G. Q. (Autor:in) / Li, S. F. Y. (Autor:in) / Chan, L. (Autor:in)
JOURNAL OF MATERIALS SCIENCE LETTERS ; 15 ; 2080-2084
01.01.1996
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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