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Defect processes causing free carrier variations around dislocations in n-type doped GaAs
Defect processes causing free carrier variations around dislocations in n-type doped GaAs
Defect processes causing free carrier variations around dislocations in n-type doped GaAs
Paetzold, O. (Autor:in) / Sonnenberg, K. (Autor:in) / Irmer, G. (Autor:in) / Jantz, W. / Baeumler, M.
01.01.1997
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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