Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Observation of Different Interfaces in Silicon Nitride by HRTEM: Influence of the Microstructure on the Creep Properties
Observation of Different Interfaces in Silicon Nitride by HRTEM: Influence of the Microstructure on the Creep Properties
Observation of Different Interfaces in Silicon Nitride by HRTEM: Influence of the Microstructure on the Creep Properties
Bernard-Granger, G. (Autor:in) / Cales, B. (Autor:in) / Duclos, R. (Autor:in) / Crampon, J. (Autor:in) / Abelard, P. / Boussuge, M. / Chartier, T. / Fantozzi, G. / Lozes, G. / Rousset, A.
01.01.1997
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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