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Observation of Different Interfaces in Silicon Nitride by HRTEM: Influence of the Microstructure on the Creep Properties
Observation of Different Interfaces in Silicon Nitride by HRTEM: Influence of the Microstructure on the Creep Properties
Observation of Different Interfaces in Silicon Nitride by HRTEM: Influence of the Microstructure on the Creep Properties
Bernard-Granger, G. (author) / Cales, B. (author) / Duclos, R. (author) / Crampon, J. (author) / Abelard, P. / Boussuge, M. / Chartier, T. / Fantozzi, G. / Lozes, G. / Rousset, A.
1997-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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