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SIMS Study of Amorphous Carbon Films Deposited on Silicon and TA6V Substrates
SIMS Study of Amorphous Carbon Films Deposited on Silicon and TA6V Substrates
SIMS Study of Amorphous Carbon Films Deposited on Silicon and TA6V Substrates
Tixier, C. (Autor:in) / Cahoreau, M. (Autor:in) / Desmaison, J. (Autor:in) / Baxter, J. / Cot, L. / Fordham, R. / Gabis, V. / Hellot, Y. / Lefebvre, M. / Le Doussal, H.
01.01.1997
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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