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Characterization of Multilayer Ceramic Membranes with the Atomic Force Microscope
Characterization of Multilayer Ceramic Membranes with the Atomic Force Microscope
Characterization of Multilayer Ceramic Membranes with the Atomic Force Microscope
Pedersen, H. G. (Autor:in) / Tranto, J. (Autor:in) / Weiland Hoej, J. (Autor:in) / Baxter, J. / Cot, L. / Fordham, R. / Gabis, V. / Hellot, Y. / Lefebvre, M. / Le Doussal, H.
01.01.1997
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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