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The origin of an anomalous, low 2 peak in x-ray diffraction spectra of MoS~2 films grown by ion beam assisted deposition
The origin of an anomalous, low 2 peak in x-ray diffraction spectra of MoS~2 films grown by ion beam assisted deposition
The origin of an anomalous, low 2 peak in x-ray diffraction spectra of MoS~2 films grown by ion beam assisted deposition
Dunn, D. N. (Autor:in) / Seitzman, L. E. (Autor:in) / Singer, I. L. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 12 ; 1191-1194
01.01.1997
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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