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Raman spectroscopy as a mapping tool for localized strain in microengineered structures
Raman spectroscopy as a mapping tool for localized strain in microengineered structures
Raman spectroscopy as a mapping tool for localized strain in microengineered structures
Wood, D. (Autor:in) / Cooper, G. (Autor:in) / Gardiner, D. J. (Autor:in) / Bowden, M. (Autor:in)
JOURNAL OF MATERIALS SCIENCE LETTERS ; 16 ; 1222-1223
01.01.1997
2 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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