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Raman spectroscopy as a mapping tool for localized strain in microengineered structures

Wood, D. / Cooper, G. / Gardiner, D. J. / Bowden, M.

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Raman spectroscopy as a mapping tool for localized strain in microengineered structures

Wood, D. / Cooper, G. / Gardiner, D. J. / Bowden, M.

Raman spectroscopy as a mapping tool for localized strain in microengineered structures

Wood, D. / Cooper, G. / Gardiner, D. J. / Bowden, M.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Raman spectroscopy as a mapping tool for localized strain in microengineered structures

Contributors:

Wood, D. (author) / Cooper, G. (author) / Gardiner, D. J. (author) / Bowden, M. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 16 ; 1222-1223

Publication date:

1997-01-01

Size:

2 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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