Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Thickness Measurement for Thin Films and Coatings Using Millimeter Waves
Thickness Measurement for Thin Films and Coatings Using Millimeter Waves
Thickness Measurement for Thin Films and Coatings Using Millimeter Waves
Han, H. C. (Autor:in) / Mansueto, E. S. (Autor:in)
RESEARCH IN NONDESTRUCTIVE EVALUATION ; 9 ; 97-118
01.01.1997
22 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1127
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