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Secondary ion emissions from fluorolubricants under several primary beam conditions by TOF-SIMS
Secondary ion emissions from fluorolubricants under several primary beam conditions by TOF-SIMS
Secondary ion emissions from fluorolubricants under several primary beam conditions by TOF-SIMS
Hoshi, T. (Autor:in) / Tozu, M. (Autor:in) / Oiwa, R. (Autor:in) / Zhanping, L. (Autor:in) / Kudo, M. (Autor:in)
APPLIED SURFACE SCIENCE ; 121/122 ; 146-151
01.01.1997
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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