A platform for research: civil engineering, architecture and urbanism
Secondary ion emissions from fluorolubricants under several primary beam conditions by TOF-SIMS
Secondary ion emissions from fluorolubricants under several primary beam conditions by TOF-SIMS
Secondary ion emissions from fluorolubricants under several primary beam conditions by TOF-SIMS
Hoshi, T. (author) / Tozu, M. (author) / Oiwa, R. (author) / Zhanping, L. (author) / Kudo, M. (author)
APPLIED SURFACE SCIENCE ; 121/122 ; 146-151
1997-01-01
6 pages
Article (Journal)
English
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
High-resolution primary ion beam probe for SIMS
British Library Online Contents | 2004
|Fast atom beam bombardment secondary ion mass spectrometry: FAB-SIMS
British Library Online Contents | 1993
|Fast atom beam bombardment secondary ion mass spectrometry: FAB-SIMS
British Library Online Contents | 1993
|SIMS: Secondary Ion Mass Spectrometry
British Library Online Contents | 1993
|SIMS — Secondary Ion Mass Spectrometry
Springer Verlag | 1992
|