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Electronic Properties of Doped SiC at Elevated Temperatures Studied by Raman Scattering
Electronic Properties of Doped SiC at Elevated Temperatures Studied by Raman Scattering
Electronic Properties of Doped SiC at Elevated Temperatures Studied by Raman Scattering
Harima, H. (Autor:in) / Hosoda, T. (Autor:in) / Nakashima, S. (Autor:in) / Pensl, G. / Morkoc, H. / Monemar, B. / Janzen, E.
01.01.1998
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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