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Hydrogenation of copper related deep states in n-type Si containing extended defects
Hydrogenation of copper related deep states in n-type Si containing extended defects
Hydrogenation of copper related deep states in n-type Si containing extended defects
Kaniewski, J. (Autor:in) / Kaniewska, M. (Autor:in) / Ornoch, L. (Autor:in) / Sekiguchi, T. (Autor:in) / Sumino, K. (Autor:in)
MATERIALS SCIENCE FORUM ; 258/263 ; 319-324
01.01.1997
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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British Library Online Contents | 1997
|Au-Related Deep States in the Presence of Extended Defects in n-type Silicon
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|Effect of hydrogenation on the properties of extended defects in semiconductors
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|Copper-related defects in silicon
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|Extended Defects in Semiconductors
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