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Hydrogenation of copper related deep states in n-type Si containing extended defects

Kaniewski, J. / Kaniewska, M. / Ornoch, L. / Sekiguchi, T. / Sumino, K.

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Hydrogenation of copper related deep states in n-type Si containing extended defects

Kaniewski, J. / Kaniewska, M. / Ornoch, L. / Sekiguchi, T. / Sumino, K.

Hydrogenation of copper related deep states in n-type Si containing extended defects

Kaniewski, J. / Kaniewska, M. / Ornoch, L. / Sekiguchi, T. / Sumino, K.

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Order at Subito €

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Document information

Title:

Hydrogenation of copper related deep states in n-type Si containing extended defects

Contributors:

Kaniewski, J. (author) / Kaniewska, M. (author) / Ornoch, L. (author) / Sekiguchi, T. (author) / Sumino, K. (author)

Published in:

MATERIALS SCIENCE FORUM ; 258/263 ; 319-324

Publication date:

1997-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Kaniewska, M. / Kaniewski, J. / Ornoch, L. et al. | British Library Online Contents | 1997

Kaniewska, M. / Kaniewski, J. / Peaker, A. R. | British Library Online Contents | 1993

Effect of hydrogenation on the properties of extended defects in semiconductors

Zozime, A. / Castaing, J. | British Library Online Contents | 1996

Copper-related defects in silicon

Knack, S. | British Library Online Contents | 2004

Extended Defects in Semiconductors

British Library Online Contents | 2007