Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Assessing the Validity of Diffraction Stress Data with the Goodness-of-Fit Statistic
Assessing the Validity of Diffraction Stress Data with the Goodness-of-Fit Statistic
Assessing the Validity of Diffraction Stress Data with the Goodness-of-Fit Statistic
Lohkamp, T. A. (Autor:in) / Winholtz, R. A. (Autor:in)
ADVANCES IN X RAY ANALYSIS ; 281-290
01.01.1997
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
539.7222
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