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Assessing the Validity of Diffraction Stress Data with the Goodness-of-Fit Statistic
Assessing the Validity of Diffraction Stress Data with the Goodness-of-Fit Statistic
Assessing the Validity of Diffraction Stress Data with the Goodness-of-Fit Statistic
Lohkamp, T. A. (author) / Winholtz, R. A. (author)
ADVANCES IN X RAY ANALYSIS ; 281-290
1997-01-01
10 pages
Article (Journal)
English
DDC:
539.7222
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