Schottky Contacts to N-Type 4H-SiC Fabricated with Ti-, Mo-, Ni- and Al-Based Metallizations

Perrone, D. / Ferrero, S. / Scaltrito, L. et al. | British Library Online Contents | 2011

Electron microscopy characterization of a molybdenum diffusion barrier in metallizations for chip carriers

He, A. / Ivey, D. G. | British Library Online Contents | 2004

LPCVD Re~xSi~yN~z diffusion barriers in Si/SiO~2/Cu metallizations

Dutron, A.-M. / Blanquet, E. / Bernard, C. et al. | British Library Online Contents | 1996

Reliability Investigation of Drain Contact Metallizations for SiC-MOSFETs

Sunner, T. / Behrens, T. / Kaden, T. | British Library Online Contents | 2013

Material transport in Al-metallizations of power-loaded SAW structures

Menzel, S. / Pekarcikova, M. / Hofmann, M. et al. | British Library Online Contents | 2005