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LPCVD Re~xSi~yN~z diffusion barriers in Si/SiO~2/Cu metallizations
LPCVD Re~xSi~yN~z diffusion barriers in Si/SiO~2/Cu metallizations
LPCVD Re~xSi~yN~z diffusion barriers in Si/SiO~2/Cu metallizations
Dutron, A.-M. (Autor:in) / Blanquet, E. (Autor:in) / Bernard, C. (Autor:in) / Bachli, A. (Autor:in) / Madar, R. (Autor:in) / Gessner, T. / Schulz, S. E.
01.01.1996
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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