Kinetics of Cristobalite Growth on Polycrystalline SiC Film Studied using High-Temperature In Situ X-Ray Diffractometry: Fid-Bau Portal

Kinetics of Cristobalite Growth on Polycrystalline SiC Film Studied using High-Temperature In Situ X-Ray Diffractometry

Kingetsu, T. / Ito, K. / Takehara, M. / Masumoto, H.

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Kinetics of Cristobalite Growth on Polycrystalline SiC Film Studied using High-Temperature In Situ X-Ray Diffractometry

Kingetsu, T. / Ito, K. / Takehara, M. / Masumoto, H.

Kinetics of Cristobalite Growth on Polycrystalline SiC Film Studied using High-Temperature In Situ X-Ray Diffractometry

Kingetsu, T. / Ito, K. / Takehara, M. / Masumoto, H.

Zugriff

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Bestellung bei Subito €

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Titel:

Kinetics of Cristobalite Growth on Polycrystalline SiC Film Studied using High-Temperature In Situ X-Ray Diffractometry

Beteiligte:

Kingetsu, T. (Autor:in) / Ito, K. (Autor:in) / Takehara, M. (Autor:in) / Masumoto, H. (Autor:in)

Erschienen in:

MATERIALS RESEARCH BULLETIN ; 33 ; 731-738

Erscheinungsdatum:

01.01.1998

Format / Umfang:

8 pages

ISSN:

0025-5408

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11 / 620

Kingetsu, T. / Ito, K. / Takehara, M. | British Library Online Contents | 1998

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Phase transformations in materials studied by TOF neutron thermo-diffractometry

Balagurov, A. M. / Mironova, G. M. | British Library Online Contents | 1993

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