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Structural Characterization of Cu Metallic Clusters in Amorphous SiO~2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction
Structural Characterization of Cu Metallic Clusters in Amorphous SiO~2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction
Structural Characterization of Cu Metallic Clusters in Amorphous SiO~2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction
D'Acapito, F. (Autor:in) / Thiaudiere, D. (Autor:in) / Zontone, F. (Autor:in) / Regnard, J. R. (Autor:in)
MATERIALS SCIENCE FORUM ; 278/281 ; 891-896
01.01.1998
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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Grazing Incidence X-Ray Fluorescence Analysis Using Synchrotron Radiation
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