Structural Characterization of Cu Metallic Clusters in Amorphous SiO~2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction: Fid-Bau Portal

Structural Characterization of Cu Metallic Clusters in Amorphous SiO~2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction

D'Acapito, F. / Thiaudiere, D. / Zontone, F. / Regnard, J. R.

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Structural Characterization of Cu Metallic Clusters in Amorphous SiO~2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction

D'Acapito, F. / Thiaudiere, D. / Zontone, F. / Regnard, J. R.

Structural Characterization of Cu Metallic Clusters in Amorphous SiO~2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction

D'Acapito, F. / Thiaudiere, D. / Zontone, F. / Regnard, J. R.

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Document information

Title:

Structural Characterization of Cu Metallic Clusters in Amorphous SiO~2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction

Contributors:

D'Acapito, F. (author) / Thiaudiere, D. (author) / Zontone, F. (author) / Regnard, J. R. (author)

Published in:

MATERIALS SCIENCE FORUM ; 278/281 ; 891-896

Publication date:

1998-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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