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Local bonding structures of SiO~2 films on H-terminated Si(100) surfaces studied by using high-resolution electron energy loss spectroscopy
Local bonding structures of SiO~2 films on H-terminated Si(100) surfaces studied by using high-resolution electron energy loss spectroscopy
Local bonding structures of SiO~2 films on H-terminated Si(100) surfaces studied by using high-resolution electron energy loss spectroscopy
Nakagawa, Y. (Autor:in) / Higashi, M. (Autor:in) / Ikeda, H. (Autor:in) / Zaima, S. (Autor:in) / Yasuda, Y. (Autor:in)
APPLIED SURFACE SCIENCE ; 130-132 ; 192-196
01.01.1998
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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