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A Study on the Nanometer Grid Method with the Scanning Tunneling Microscope
A Study on the Nanometer Grid Method with the Scanning Tunneling Microscope
A Study on the Nanometer Grid Method with the Scanning Tunneling Microscope
Huimin, X. (Autor:in) / Fulong, D. (Autor:in) / Haiqiang, Y. (Autor:in) / Ning, L. (Autor:in) / Dietz, P. (Autor:in) / Schmidt, A. (Autor:in)
EXPERIMENTAL TECHNIQUES ; 22 ; 23-25
01.01.1998
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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