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Application of Surface Fabrication to Strain Measurement in Nanometer Scale with the Scanning Tunneling Microscope
Application of Surface Fabrication to Strain Measurement in Nanometer Scale with the Scanning Tunneling Microscope
Application of Surface Fabrication to Strain Measurement in Nanometer Scale with the Scanning Tunneling Microscope
Miyahara, K. (Autor:in) / Matsuoka, S. (Autor:in) / Nagashima, N. (Autor:in) / Masuda, H. (Autor:in)
JOURNAL OF TESTING AND EVALUATION ; 22 ; 121
01.01.1994
121 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620
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