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Mechanism of TiN barrier-metal oxidation in a ferroelectric random access memory
Mechanism of TiN barrier-metal oxidation in a ferroelectric random access memory
Mechanism of TiN barrier-metal oxidation in a ferroelectric random access memory
Kushida-Abdelghafar, K. (Autor:in) / Torii, K. (Autor:in) / Takatani, S. (Autor:in) / Matsui, Y. (Autor:in) / Fujisaki, Y. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 13 ; 3265-3269
01.01.1998
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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