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Growth of zinc sulfide thin films on (100)Si with the successive ionic layer adsorption and reaction method studied by atomic force microscopy
Growth of zinc sulfide thin films on (100)Si with the successive ionic layer adsorption and reaction method studied by atomic force microscopy
Growth of zinc sulfide thin films on (100)Si with the successive ionic layer adsorption and reaction method studied by atomic force microscopy
Valkonen, M. P. (Autor:in) / Lindroos, S. (Autor:in) / Resch, R. (Autor:in) / Leskelae, M. (Autor:in) / Friedbacher, G. (Autor:in) / Grasserbauer, M. (Autor:in)
APPLIED SURFACE SCIENCE ; 136 ; 131-136
01.01.1998
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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