Growth of zinc sulfide thin films on (100)Si with the successive ionic layer adsorption and reaction method studied by atomic force microscopy: Fid-Bau Portal

Growth of zinc sulfide thin films on (100)Si with the successive ionic layer adsorption and reaction method studied by atomic force microscopy

Valkonen, M. P. / Lindroos, S. / Resch, R. / Leskelae, M. / Friedbacher, G. / Grasserbauer, M.

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Growth of zinc sulfide thin films on (100)Si with the successive ionic layer adsorption and reaction method studied by atomic force microscopy

Valkonen, M. P. / Lindroos, S. / Resch, R. / Leskelae, M. / Friedbacher, G. / Grasserbauer, M.

Growth of zinc sulfide thin films on (100)Si with the successive ionic layer adsorption and reaction method studied by atomic force microscopy

Valkonen, M. P. / Lindroos, S. / Resch, R. / Leskelae, M. / Friedbacher, G. / Grasserbauer, M.

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Title:

Growth of zinc sulfide thin films on (100)Si with the successive ionic layer adsorption and reaction method studied by atomic force microscopy

Contributors:

Valkonen, M. P. (author) / Lindroos, S. (author) / Resch, R. (author) / Leskelae, M. (author) / Friedbacher, G. (author) / Grasserbauer, M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 136 ; 131-136

Publication date:

1998-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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