Study of Crystallographic Orientation of in situ �-Si~3N~4 Composite by Electron Back Scattered Diffraction (EBSD) Method: Fid-Bau Portal

Study of Crystallographic Orientation of in situ -Si~3N~4 Composite by Electron Back Scattered Diffraction (EBSD) Method

Yasutomi, Y. / Sakaida, Y. / Hirosaki, N. / Ikuhara, Y.

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Study of Crystallographic Orientation of in situ -Si~3N~4 Composite by Electron Back Scattered Diffraction (EBSD) Method

Yasutomi, Y. / Sakaida, Y. / Hirosaki, N. / Ikuhara, Y.

Study of Crystallographic Orientation of in situ -Si~3N~4 Composite by Electron Back Scattered Diffraction (EBSD) Method

Yasutomi, Y. / Sakaida, Y. / Hirosaki, N. / Ikuhara, Y.

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Titel:

Study of Crystallographic Orientation of in situ -Si~3N~4 Composite by Electron Back Scattered Diffraction (EBSD) Method

Beteiligte:

Yasutomi, Y. (Autor:in) / Sakaida, Y. (Autor:in) / Hirosaki, N. (Autor:in) / Ikuhara, Y. (Autor:in) / Niihara, K. / Sekino, T. / Yasuda, E. / Sasa, T.

Erschienen in:

Proceedings of the 2nd International Symposium on the Science of Engineering Ceramics (EnCera '98) ; 31-34

KEY ENGINEERING MATERIALS

Erscheinungsdatum:

01.01.1999

Format / Umfang:

4 pages

ISSN:

1013-9826

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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