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Study of Crystallographic Orientation of in situ -Si~3N~4 Composite by Electron Back Scattered Diffraction (EBSD) Method
Study of Crystallographic Orientation of in situ -Si~3N~4 Composite by Electron Back Scattered Diffraction (EBSD) Method
Study of Crystallographic Orientation of in situ -Si~3N~4 Composite by Electron Back Scattered Diffraction (EBSD) Method
Yasutomi, Y. (author) / Sakaida, Y. (author) / Hirosaki, N. (author) / Ikuhara, Y. (author) / Niihara, K. / Sekino, T. / Yasuda, E. / Sasa, T.
1999-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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